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Lehigh Microscopy School’s 45th year

Lehigh Microscopy School opens this week for its 45th year! Engineers, scientists, and technicians from around the country have taken over 5800 courses covering Scanning Electron Microscopy (SEM), X-ray microanalysis, Focused Ion Beam (FIB) instrumentation, and other specialty courses.

The program runs all this week, from June 7 through June 12, 2015. Find out more at the Lehigh Microscopy School web site.

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